Freescale Semiconductor /MKW21Z4 /XCVR_CTRL_REGS /DTEST_CTRL

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Interpret as DTEST_CTRL

31 2827 2423 2019 1615 1211 87 43 0 0 0 0 0 0 0 0 00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0DTEST_PAGE0 (0)DTEST_EN 0GPIO0_OVLAY_PIN 0GPIO1_OVLAY_PIN 0 (00)TSM_GPIO_OVLAY 0DTEST_SHFT 0 (RAW_MODE_I)RAW_MODE_I 0 (RAW_MODE_Q)RAW_MODE_Q

DTEST_EN=0, TSM_GPIO_OVLAY=00

Description

DIGITAL TEST MUX CONTROL

Fields

DTEST_PAGE

DTEST Page Selector

DTEST_EN

DTEST Enable

0 (0): Disables DTEST. The DTEST pins assume their mission function.

1 (1): Enables DTEST. The contents of the selected page (DTEST_PAGE) will appear on the DTEST output pins.

GPIO0_OVLAY_PIN

GPIO 0 Overlay Pin

GPIO1_OVLAY_PIN

GPIO 1 Overlay Pin

TSM_GPIO_OVLAY

TSM GPIO Overlay Pin Control

0 (00): there is no overlay, and the DTEST Page Table dictates the node that appears on each DTEST pin.

1 (01): the register GPIO0_OVLAY_PIN[3:0] selects the DTEST pin on which GPIO0_TRIG_EN will appear.

DTEST_SHFT

DTEST Shift Control

RAW_MODE_I

DTEST Raw Mode Enable for I Channel

RAW_MODE_Q

DTEST Raw Mode Enable for Q Channel

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